Work

A Novel Application of Machine Learning Methods to Model Microcontroller Upset Due to Intentional Electromagnetic Interference

Year: 2017

Type: article

Source: UNM’s Digital Repository (University of New Mexico)

Author: Rusmir Bilalic

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2762398558

FWCI:

Cites: 37

Cited by: 1

Related to: 10