Work

Determination of defect density, crystallite size and number of graphene layers in graphene analogues using X-ray diffraction and Raman spectroscopy

Year: 2017

Type: article

Abstract: In this study, X-ray diffraction and Raman spectroscopic techniques have been wielded for determination of number of graphene layers per domain, crystallite size, interlayer spacing and defect density in bulk samples of chemically synthesized graphitic oxide (GrO) and reduced GrO (RGrO). Particularly, the ready to use and general mathematical equations have been presented for obtaining above mentioned parameters directly using the full width half maxima (FWHM) of XRD peaks and intensity ratios of Raman D- and G-bands. The results reflect that upon reduction, crystallites shrink in dimensions ultimately leads to decrease in number of graphene layers per domain and apparent increase in defect density.

Source: IR@NPL (CSIR-The National Physical Laboratory(NPL))

Authors: Rahul Sharma, Neakanshika Chadha, Parveen Saini

Language: English

Topic: Graphene research and applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: diamond

OpenAlex ID: W2763488216

FWCI: 3.182

Cites:

Cited by: 121

Related to: 10