Work

High-speed channel modeling with deep neural network for signal integrity analysis

Year: 2017

Type: conference-paper

Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

DOI: 10.1109/epeps.2017.8329733

Authors: Tianjian Lu, Ken Wu, Zhiping Yang, Ju Sun

Institutions: Google (United States), Stanford University

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2765429562

FWCI: 0.387

Cites: 8

Cited by: 6

Related to: 10