Focal Spot and Wavefront Sensing of an X-Ray Free Electron laser using Ronchi shearing interferometry
Year: 2017
Type: article
Abstract: The Linac Coherent Light Source (LCLS) is an X-ray source of unmatched brilliance, that is advancing many scientific fields at a rapid pace. The highest peak intensities that are routinely produced at LCLS take place at the Coherent X-ray Imaging (CXI) instrument, which can produce spotsize at the order of 100 nm, and such spotsizes and intensities are crucial for experiments ranging from coherent diffractive imaging, non-linear x-ray optics and high field physics, and single molecule imaging. Nevertheless, a full characterisation of this beam has up to now not been performed. In this paper we for the first time characterise this nanofocused beam in both phase and intensity using a Ronchi Shearing Interferometric technique. The method is fast, in-situ, uses a straightforward optimization algoritm, and is insensitive to spatial jitter.
Source: Scientific Reports
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,690
Awards: G1229526393, G1286251239, G2371548206, G262532246, G303061748, G4235786860, G4817264520, G4908923434, G495301720, G498139845, G5095035520, G5498918106, G5570207115, G6092816558, G628751139, G6550344761, Erzeugung und Charakterisierung von nanofokussierten XFEL-Pulsen zur Abbildung ultraschneller Prozesse in Materie, G7070193645, G7083997402, G7088042312, G7283024673, G7313278570, G7973539974, G8382000481, G8480502354, G911061179, G969889393
OpenAlex ID: W2766179173
