Work

Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules

Year: 2017

Type: conference-paper

Source: Annual Conference of the IEEE Industrial Electronics Society (IECON)

DOI: 10.1109/iecon.2017.8216259

Authors: Haoze Luo, Francesco Iannuzzo, Frede Blaabjerg, Wuhua Li, Xiangning He

Institutions: Aalborg University, Università degli studi di Cassino e del Lazio Meridionale, Zhejiang University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2773493276

FWCI: 3.147

Cites: 12

Cited by: 17

Related to: 10