Work

Recognizing eye tracking traits for source code review

Year: 2017

Type: conference-paper

Study design: Observational Study

Source: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)

DOI: 10.1109/etfa.2017.8247637

Authors: K R Chandrika, J Amudha, Sithu D Sudarsan

Institutions: Amrita Vishwa Vidyapeetham, ABB (India)

Language: English

Topic: Software Engineering Research

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2783179294

FWCI: 1.463

Cites: 13

Cited by: 23

Related to: 10