Work

RTN based oxygen vacancy probing method for Ox-RRAM reliability characterization and its application in tail bits

Year: 2017

Type: conference-paper

Source: Technical digest - International Electron Devices Meeting/Technical digest

DOI: 10.1109/iedm.2017.8268435

Authors: P. Huang, D. B. Zhu, C. Liu, Z. Zhou, Z. Dong, H. Jiang, W. S. Shen, L. F. Liu, X. Y. Liu, J. F. Kang

Institutions: Peking University, National Key Laboratory of Science and Technology on Micro/Nano Fabrication

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2785928063

FWCI: 5.02

Cites: 5

Cited by: 28

Related to: 10