Work

Highly efficient computer algorithm for identifying layer thickness of atomically thin 2D materials

Year: 2018

Type: article

Source: Journal of Physics D Applied Physics

DOI: 10.1088/1361-6463/aaac19

Authors: Jekwan Lee, Seungwan Cho, Soohyun Park, Hyemin Bae, Minji Noh, Beom Kim, Chihun In, Seunghoon Yang, Sooun Lee, Seung Young Seo, Jehyun Kim, Chul-Ho Lee, Woo-Young Shim, Moon-Ho Jo, Dohun Kim, Hyunyong Choi

Institutions: Yonsei University, Korea University, Pohang University of Science and Technology, Seoul National University, Institute for Basic Science

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation of Korea

Awards: G1431068252, G3025226545, G3043961017, G3155846344, G374610683, G6061293746

OpenAlex ID: W2787168646

FWCI: 0.361

Cites: 39

Cited by: 8

Related to: 10