Work

A smart way to identify and extract repeated patterns of a layout

Year: 2018

Type: conference-paper

Source: Design-Process-Technology Co-optimization for Manufacturability

DOI: 10.1117/12.2297303

Authors: Chenming Zhang, Han Chen, Jun Zhu, Chunshan Du, Qijian Wan, Zhihao Chu, Zhengfang Liu, Xinyi Hu, Fang Wei, Tingting Gu

Institution: Shanghai Huali Microelectronics (China)

Language: English

Topic: VLSI and FPGA Design Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2791100946

FWCI:

Cites: 3

Cited by: 1

Related to: 10