Work

Universal test system for system embedded optical interconnect

Year: 2018

Type: conference-paper

DOI: 10.1117/12.2289590

Authors: Richard C. Pitwon, Marika Immonen, Henning Schroeder, Marcel Neitz, Kai Wang

Institutions: Seagate (United Kingdom), Fraunhofer Institute for Reliability and Microintegration

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2793807002

FWCI: 0.798

Cites: 3

Cited by: 3

Related to: 10