Work

Quantitative Stress Characterization in GaN Films grown on patterned Si(111) by Micro-Raman Spectroscopy

Year: 2004

Type: article

Authors: DeLiang Wang, Shujing Jia, Jing Kevin Chen, Y. Dikme, Philipp van Gemmern, Yunhao Lin, M. Heuken

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2794344439

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Related to: 10