Work

Self-Supervised Feature Learning by Learning to Spot Artifacts

Year: 2018

Type: conference-paper

Source: IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings

DOI: 10.1109/cvpr.2018.00289

Authors: Simon Jenni, Paolo Favaro

Institution: University of Bern

Language: English

Topic: Domain Adaptation and Few-Shot Learning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2798680770

FWCI: 6.216

Cites: 50

Cited by: 114

Related to: 10