Investigation of data pattern effects on nitride charge lateral migration in a charge trap flash memory by using a random telegraph signal method
Work
Year: 2018
Type: article
Cites: 17
Cited by: 3
Related to: 10
FWCI: 0.625
Citation percentile (by year/subfield): 60.43
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed