Work

A consistent full-field integrated DIC framework for HR-EBSD

Year: 2018

Type: article

Source: Ultramicroscopy

DOI: 10.1016/j.ultramic.2018.05.001

Authors: T. Vermeij, J.P.M. Hoefnagels

Institution: Eindhoven University of Technology

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2799813231

FWCI: 2.265

Cites: 41

Cited by: 57

Related to: 10