Work

Effect of annealing conditions on the electrical properties of ALD-grown polycrystalline BiFeO 3 films

Year: 2018

Type: article

Source: Journal of Materials Chemistry C

DOI: 10.1039/c7tc05755e

Authors: Iryna S. Golovina, Matthias Falmbigl, Aleksandr V. Plokhikh, Thomas C. Parker, Craig Johnson, Jonathan E. Spanier

Institutions: National Academy of Sciences of Ukraine, V.E. Lashkaryov Institute of Semiconductor Physics, Institute of Semiconductor Physics, Drexel University, DEVCOM Army Research Laboratory, United States Army

Language: English

Topic: Multiferroics and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Office of Naval Research, Division of Materials Research, Division of Chemical, Bioengineering, Environmental, and Transport Systems, Army Research Laboratory

Awards: G2446244938, G3596267601, G5172696675, G5541680377

OpenAlex ID: W2801358726

FWCI: 1.274

Cites: 64

Cited by: 25

Related to: 10