Work

Specification analysis of the deteriorating sensor for required lifetime prognostic performance

Year: 2018

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2018.04.004

Authors: Jian-Xun Zhang, Xiao-Sheng Si, Dang-Bo Du, Chang-Hua Hu

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G1977667071, G2464202759, G2885405594, G6872528065

OpenAlex ID: W2801993623

FWCI: 0.288

Cites: 42

Cited by: 7

Related to: 10