Work

Proposing a Solution for Single-Event Upset in 1T1R RRAM Memory Arrays

Year: 2018

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2018.2830791

Authors: Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei

Institutions: University of Waterloo, Arizona State University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2802305152

FWCI: 0.283

Cites: 40

Cited by: 13

Related to: 10