OpenAlex | Measurements and Simulations of Single-Event Upsets in a 28-nm FPGA

Measurements and Simulations of Single-Event Upsets in a 28-nm FPGA

Work

Year: 2018

Type: article

Abstract: Single-event upsets in the configuration memory of the 28-nm Xilinx Kintex-7 FPGA, used in the PANDA electromagnetic calorimeter, have been studied. Results from neutron and proton irradiations at ene... more

Authors M. Preston, P.-E. Tegnér, Hans Calén, T. Johansson, K. Makónyi +3 more

Institutions Stockholm University, Uppsala University, University of Groningen

Cites: 9

Cited by: 4

Related to: 10

FWCI: 0.386

Citation percentile (by year/subfield): 51.27

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Sustainable Development Goal Affordable and clean energy

Open Access status: hybrid