Research on hot carrier reliability of n-MOSFET in deep submicron technology
Work
Year: 2017
Type: article
Authors Jingyu Shen, Ming Zhang, Can Tan, Xue Fan, Wei Li
Institutions University of Electronic Science and Technology of China, National Engineering Research Center of Electromagnetic Radiation Control Materials
Cites: 9
Cited by: 4
Related to: 10
FWCI: 0.608
Citation percentile (by year/subfield): 68.38
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed