Work

First Born model for reflection-mode Fourier ptychographic microscopy

Year: 2018

Type: conference-paper

Source: Imaging and Applied Optics

DOI: 10.1364/math.2018.mm3d.2

Authors: Alex Matlock, Anne Sentenac, Ji Yi, Lei Tian

Institutions: Boston University, Centre National de la Recherche Scientifique, Aix-Marseille Université, Institut Fresnel, Centrale Méditerranée

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2809219194

FWCI:

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