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Point defect engineering in thin-film solar cells

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Year: 2018
Type: review
Source: Nature Reviews Materials
DOI: 10.1038/s41578-018-0026-7
Authors: Ji Sang Park, Sunghyun Kim, Zijuan Xie, Aron Walsh
Institutions: Thomas Young Centre, Imperial College London, Harbin Institute of Technology, Yonsei University
Language: English

Topic: Chalcogenide Semiconductor Thin Films
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Affordable and clean energy

Open Access status: closed
OpenAlex ID: W2809606226
FWCI: 1.91
Cites: 258
Cited by: 424
Related to: 10
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