Work

Advancements in X-Ray Analysis for Correlative Microscopy

Year: 2018

Type: article

Abstract: Jeff Gelb, Sylvia Lewis, SH Lau, Janos Kirz, Wenbing Yun; Advancements in X-Ray Analysis for Correlative Microscopy, Microscopy and Microanalysis, Volume 2

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927618002283

Authors: Jeff Gelb, Sylvia Lewis, SH Lau, Janos Kirz, Wenbing Yun

Institutions: Sigray (United States), Lawrence Berkeley National Laboratory

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W2887148575

FWCI:

Cites: 3

Cited by:

Related to: 10