Work

Next-generation X-ray Optics for High Resolution Applications

Year: 2018

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927618013843

Authors: Wenbing Yun, Mark Cordier, Benjamin Stripe, Sylvia Lewis, Janos Kirz

Institution: Sigray (United States)

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

Funders: National Science Foundation, U.S. Department of Energy

Award: SBIR Phase I: Development of a Dual Energy Micro-focused X-ray Excitation Beam for Chemical Analysis and Materials Characterization

OpenAlex ID: W2887617667

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