An All-Digital True-Random-Number Generator with Integrated De-correlation and Bias Correction at 3.2-to-86 MB/S, 2.58 PJ/Bit in 65-NM CMOS
Year: 2018
Type: conference-paper
Source: Symposium on VLSI Circuits
Authors: V. Rajesh Pamula, Xun Sun, Sung Kim, Fahim ur Rahman, Baosen Zhang, Visvesh S. Sathe
Institution: University of Washington
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2898748682