Work

AFM in a split second

Year: 2018

Type: article

Abstract: A new development in high-speed atomic force microscopy enables microsecond resolution.

Source: Nature Methods

DOI: 10.1038/s41592-018-0289-3

Author: Katarzyna M. Marcinkiewicz

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $12,690

OpenAlex ID: W2903591685

FWCI:

Cites: 1

Cited by: 2

Related to: 10