Work

Single Event Upset Results from the Radiation Hardened Electronic Memory Experiment on the International Space Station

Year: 2018

Type: conference-paper

DOI: 10.1109/nsrec.2018.8584285

Authors: David Alexander, Alonzo Vera, Wesley Morris, James Christian, David Gifford, Keith Avery, Gabriel Urbaitis, Connie Li, Zack Daniels

Institutions: University of New Mexico, Ideas Engineering & Technology (United States), Radiation Monitoring Devices (United States), Vorago Technologies (United States), United States Air Force Research Laboratory

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2906646374

FWCI: 1.597

Cites: 3

Cited by: 13

Related to: 10