Multipoint Background Analysis: Gaining Precision and Accuracy in Microprobe Trace Element Analysis
Work
Year: 2019
Type: article
Source: Microscopy and Microanalysis
Institutions University of Colorado Boulder, University of Massachusetts Amherst, University of Tasmania, University of Oregon
Cites: 45
Cited by: 38
Related to: 10
FWCI: 1.441
Citation percentile (by year/subfield): 99.96
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Sustainable Development Goal Reduced inequalities
Open Access status: closed