Work

Temporal sequence learning with a history-sensitive probabilistic learning rule intrinsic to oxygen vacancy-based RRAM

Year: 2018

Type: conference-paper

Source: Technical digest - International Electron Devices Meeting/Technical digest

DOI: 10.1109/iedm.2018.8614489

Authors: J. Doevenspeck, R. Degraeve, A. Fantini, P. Debacker, D. Verkest, R. Lauwereins, W. Dehaene

Institutions: KU Leuven, IMEC

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2912240933

FWCI: 1.197

Cites: 6

Cited by: 5

Related to: 10