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Characterization of 3.3 kV and 6.5 kV SiC MOSFETs
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Year:
2017
Type:
article
Authors:
Takui Sakaguchi,
Masatoshi Aketa,
Takashi Nakamura,
Masaharu Nakanishi,
Munaf Rahimo
Language:
English
Topic:
Silicon Carbide Semiconductor Technologies
Subfield:
Electrical and Electronic Engineering
Field:
Engineering
Domain:
Physical Sciences
SDG:
Industry, innovation and infrastructure
Open Access status:
closed
OpenAlex ID:
W2916469791
FWCI:
1.339
Cites:
Cited by:
18
Related to:
10