Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations
Work
Year: 2019
Type: article
Abstract: In situ transmission electron microscope (TEM) characterization techniques provide valuable information on structure–property correlations to understand the behavior of materials at the nanoscale. Ho... more
Source: Microscopy and Microanalysis
Authors Krishna Kanth Neelisetty, Xiaoke Mu, Sebastian Gutsch, Alexander Vahl, Alan Molinari +7 more
Institutions Karlsruhe Institute of Technology, Technical University of Darmstadt, University of Freiburg, Fachhochschule Kiel, Helmholtz-Institute Ulm
Cites: 54
Cited by: 30
Related to: 10
FWCI: 1.277
Citation percentile (by year/subfield): 83.28
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
APC paid (est): $3,255