Process fault diagnosis via the integrated use of graphical lasso and Markov random fields learning & inference
Year: 2019
Type: article
Source: Computers & Chemical Engineering
Authors: Changsoo Kim, Hodong Lee, Won Bo Lee
Institution: Seoul National University
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G7055530959, G7742615470
OpenAlex ID: W2923318917