Work

d2Dplot: 2D X-ray diffraction data processing and analysis for through-the-substrate microdiffraction

Year: 2019

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s160057671900219x

Authors: Oriol Vallcorba, Jordi Rius

Institutions: ALBA Synchrotron (Spain), Institut de Ciència de Materials de Barcelona

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: Ministerio de Economía y Competitividad

OpenAlex ID: W2925486094

FWCI: 1.019

Cites: 25

Cited by: 19

Related to: 10