Year: 2011
Type: article
Abstract: With a ${}^{9}{\mathrm{Be}}^{+}$ trapped-ion hyperfine-state qubit, we demonstrate an error probability per randomized single-qubit gate of $2.0(2)\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}5}$, below the threshold estimate of ${10}^{\ensuremath{-}4}$ commonly considered sufficient for fault-tolerant quantum computing. The ${}^{9}{\mathrm{Be}}^{+}$ ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.
Source: Physical Review A
Authors: K. R. Brown, A. C. Wilson, Y. Colombe, C. Ospelkaus, A. M. Meier, E. Knill, D. Leibfried, D. J. Wineland
Institution: National Institute of Standards and Technology
Language: Latvian
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1978138256