Work

Error Costs, Ratio Tests, and Patent Antitrust Law

Year: 2020

Type: article

Source: Review of Industrial Organization

DOI: 10.1007/s11151-020-09761-3

Authors: Keith N. Hylton, Wendy Xu

Institution: Boston University

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

SDG: Peace, justice, and strong institutions

Open Access status: green

OpenAlex ID: W2935367601

FWCI: 0.461

Cites: 13

Cited by: 4

Related to: 10