Year: 2019
Type: article
Abstract: An experimental setup is developed to measure the thermoelectric properties of semiconductor nanowires with diameters of up to 5 nm in dielectric matrices. This setup makes it possible to measure the electrical resistance and thermoelectric power of nanostructured samples in the temperature range of 77–400 K.
Source: Физика и техника полупроводников
Authors: О.Н. Урюпин, А.А. Шабалдин
Institution: Ioffe Institute
Language: Russian
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W2935983281