Work

The problem of template matching test in the testing randomness by NIST

Year: 2005

Type: article

Source: IEICE Technical Report; IEICE Tech. Rep.

Authors: Yuichi Takeda, Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama

Language: English

Topic: Cryptographic Implementations and Security

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2938417614

FWCI: 0.335

Cites:

Cited by: 4

Related to: 10