Work

Enhancing resolution in coherent microscopy using deep learning

Year: 2019

Type: conference-paper

Source: Conference on Lasers and Electro-Optics

DOI: 10.23919/cleo.2019.8749690

Authors: Tairan Liu, Kevin de Haan, Yair Rivenson, Zhensong Wei, Xin Zeng, Yibo Zhang, Aydogan Özcan

Institutions: California NanoSystems Institute, University of California, Los Angeles

Language: English

Topic: Advanced Image Processing Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2944038209

FWCI:

Cites: 6

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Related to: 10