Work

Developing silicon photonics technologies with a wafer-level test station

Year: 2018

Type: article

Abstract: Imec and FormFactor present a unique wafer-level test solution that enables semi-automatic testing of passive and active silicon photonics components and circuits.

Source: TU/e Research Portal

Authors: Jeroen De Coster, Erik Jan Marinissen, Joris Van Campenhout, Bryan Bolt, Daniel Rishavy

Institution: FormFactor (United States)

Language: English

Topic: Photonic and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: green

OpenAlex ID: W2944681943

FWCI:

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Related to: 10