A New Approach to Validate GaN FET Reliability to Power-Line Surges Under Use-Conditions
Year: 2019
Type: conference-paper
Authors: Sandeep R. Bahl, Paul Brohlin
Institution: Texas Instruments (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2945025225