Work

PCFI: Program Counter Guided Fault Injection for Accelerating GPU Reliability Assessment

Year: 2019

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.23919/date.2019.8714781

Authors: Fritz G. Previlon, Charu Kalra, Devesh Tiwari, David R. Kaeli

Institution: Northeastern University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2945222589

FWCI: 2.785

Cites: 12

Cited by: 12

Related to: 10