Work

The Competing Aging Effects on SRAM Operating Life Tests

Year: 2019

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2019.2916481

Authors: Wei-Ting Kary Chien, Jessica Xuejiao Luo, Mark Zhang

Institution: Semiconductor Manufacturing International (China)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2946086933

FWCI: 0.264

Cites: 18

Cited by: 8

Related to: 10