Work

Nanoscale Thermal, Electrical and Thermoelectric Measurements by Integrated Scanning Thermal Probe Microscopy

Year: 2002

Type: conference-paper

Source: International Heat Transfer Conference (IHTC)

DOI: 10.1615/ihtc12.4190

Authors: Andrew Minor, Deyu Li, Michael Chapp, Arun Majumdar

Institutions: University of California, Berkeley, Vanderbilt University

Language: English

Topic: Thermal properties of materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2946103930

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