Work

Freeform Surface Characterization and Instrument Alignment for Freeform Space Applications

Year: 2019

Type: conference-paper

Abstract: CMM metrology provides simple, 3D surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.

Source: Optical Design and Fabrication Congress

DOI: 10.1364/freeform.2019.fm4b.6

Authors: Manal Khreishi, Raymond Ohl, Joseph Howard, Jonathan Papa, Clark Hovis, Andrew Howe, Theodore Hadjimichael, Patrick Thompson, Ron Shiri, Garrett West, Adam Phenis, Rongguang Liang

Institutions: Goddard Space Flight Center, University of Arizona, Norfolk State University

Language: English

Topic: Advanced Measurement and Metrology Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2947824975

FWCI:

Cites: 2

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Related to: 10