Year: 2010
Type: article
Abstract: A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or "phase problem") for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of approximately 1 attosecond (10(-18) s) in time and <1 A in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided.
Source: Advanced Materials
Authors: Peter Abbamonte, Gerard C. L. Wong, David G. Cahill, James P. Reed, Robert H. Coridan, Nathan W. Schmidt, Ghee Hwee Lai, Young Il Joe, Diego Casa
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2134389639