Nanoscale Thermal, Electrical, and Thermoelectric Measurements Using Batch-Fabricated Scanning Probes
Year: 2001
Type: conference-paper
Institutions: University of California System, IBM Research - Austin
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2952419330
