Work

Testvector pertinence for SCA conformance evaluation

Year: 2015

Type: conference-paper

Source: HAL

Authors: Ribault, Alain, Legeard, Bruno, Moy, Christophe, Le Roy, Frédéric, Jaffuel, Eddie

Institutions: Kereval (France), Smartesting (France), Institut d'Électronique et des Technologies du numéRique, École nationale supérieure de techniques avancées Bretagne

Language: English

Topic: Embedded Systems Design Techniques

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2952635895

FWCI:

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