Work

Family Assessment Device (FAD) 1983

Year: 2007

Type: article

Source: Open Scholarship Institutional Repository (Washington University in St. Louis)

Authors: Nathan B. Epstein, Lawrence M Baldwin, Duane S. Bishop

Language: English

Topic: Psychological Testing and Assessment

Subfield: Applied Psychology

Field: Psychology

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2953230943

FWCI: 1.068

Cites:

Cited by: 5

Related to: 10