Work

Detection of Insulator Defects Based on YOLO V3

Year: 2019
Type: conference-paper
Authors: Fei Guo, Kun Hao, Mengqi Xia, Lu Zhao, Li Wang, Qi Liu
Language: English
Open Access status: closed
OpenAlex ID: W2953625113
FWCI: 5.529
Cites: 5
Cited by: 12
Related to: 10