Work

SIM Comparison of DC Resistance Standards at 1 {Ω}, 1 M{Ω}, and 1 G{Ω} | NIST

Year: 2009

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

Authors: Dean G. Jarrett, Randolph E. Elmquist, Nien F. Zhang, Alejandra Tonina, Maurizio Porfiri, Janice Fernandes, H Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, Dave Inglis, Kai Wendler, Felipe Hernandez-Marquez, Blanca Rodríguez

Language: English

Topic: Advanced Electrical Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2954032344

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