Investigation of Vertical Current Phenomena in the Insulator/Oxide Semiconductor Heterojunction Using XPS Analysis and an Atmospheric-Pressure Plasma Treatment System
Year: 2019
Type: article
Source: ACS Applied Electronic Materials
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G3290600800
OpenAlex ID: W2965130935
